54I-7 |
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F. LOU1, F. Ren, P. Yong, and L. Wang4. (1) College of Food Science & Nutritional Engineering, China Agricultural Univ., Box 303, East Campus, No. 17 Qinghua Donglu, Haidian District, Beijing, 100083, China, (2) Grain Processing Corp., 1600 Oregon Street, Muscatine, IA 52761 Putrescine (put) and cadaverine (cav) have been found as useful chemical indicators for bacterial spoilage in meat products. High-performance liquid chromatography (HPLC) and gas chromatography (GC) are widely used as routine analyses for the two compounds. However these methods are both expensive and time-consuming. Chemiluminescence ?Flow Injection Analysis (CL-FIA) System has been employed in food products like drinks and cheeses due to its advantage of convenience and speed. Detectors used previously in most CL-FIA methods were photomultipliers (PM) and photodiodes (PD). Photomultipliers are more sensitive than photodiodes. The purpose of this study was to develop a sensitive FIA system for rapid determination of put and cav by using photomultipliers PM to detect chemiluminescence (CL) initiated by hydrogen peroxides resulted from enzymatic oxidation of the biogenic amines. Meat samples stored at 0°C for 2 to 21 days after slaughtering were used. Putrescine (put) and cadaverine (cav) extracted from these samples were measured by using both a CL-FIA system and HPLC system respectively. The chemiluminescence was initiated by a putrescine oxidase/peroxidase reaction. A pre-column OPA (o-phthalaldehyde)-amine derivatisation was applied in the HPLC analysis. At the same time, microscopic bacterial counts on each sample were performed at the same time. Our results showed that responses of the CL-FIA system increased after the bacterial counts reached 107. No difference in response was noticed when bacterial counts were less than 107. Neither Put nor Cad was detected by HPLC in these samples. Put and Cad can be rapidly determined with higher sensitivity by a CL-FIA system equipped with a PM detector.
Session 54I, Toxicology & Safety Evaluation: General
2005 IFT Annual Meeting, July 15-20 - New Orleans, Louisiana |