14B-9

Physical properties of amaranth grain

C. I. BERISTAIN1, X. Tamayo1, E. Azuara1, and E. J. Vernon-Carter2. (1) Instituto de Ciencias Basicas, Universidad Veracruzana, Apartado Postal 575, Xalapa, Veracruz, 91000, Mexico, (2) Ingenieria Quimica, Universidad Autonoma Metropolitana-Ixtapalapa, Av. Michoacan y la Purisima S/N Ixtapalapa, Mexico D.F., 09340, Mexico

The amaranth has a great alimentary importance because of its nutritional composition and enormous industrial aplication, as in the food industry, cosmetics, colorants and biodegradable plastics industries.

The objetive of this study was to determine the physical properties of the amaranth grain.

Moisture and fat contents were determined. The size was measured with a micrometer; the grain shape was obtained in terms of sphericity, roundness and aspect ratio. The mass of individual grains were determined in a thermogravimetric analyzer to an accuracy of 0.001 mg. True density was determined by the water displascement technique. The coefficient of static friction of the grain was obtained with respect to three structural materials.

Results showed a moisture content of 6.63% and fat content of 6.2%.

The average grain length, width and thickness were 0.184, 0.174 and 0.172 cm respectively, whereas, area, sphericity, roundness and aspect ratio were 0.101 cm2, 96.04%, 78.59% and 94.77% respectively. The average mass and volume of grain were 0.903 mg and 0.006 cm3 respectively. Reported values were means of 100 observations.

True density, bulk density and porosity were 0.12 g/cm3, 0.1133 g/cm3 and 47.4% respectively. On three different surfaces, static coefficient of friction varied from 0.68 to 1.12, whereas the angle of repose varied from 30.5 to 45.92°C depending on the used method.Reported values are means of ten determinations.

Physical properties are often required in the design of processing machinaries or adaptation of existing ones such as hoppers, dehullers and sundry grain.

Session 14B, Food Chemistry: Physicochemical properties
8:30 AM - 12:00 PM, Sunday AM

2003 IFT Annual Meeting - Chicago,